Ion-tofジャパン
http://www.tagen.tohoku.ac.jp/general/organization/CAF/CAFdA-7.html Web30 mrt. 2024 · All experiments were performed with a TOF-SIMS V instrument (ION-TOF GmbH, Germany) equipped with a bismuth liquid metal ion source. The secondary ions were generated by the 25-keV Bi 3 + primary ion beam. In the experiments, a beam was set up to produce a beam current of approximately 0.1 pA with a beam size of approximately …
Ion-tofジャパン
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WebIONTOF GmbH Heisenbergstr.15 48149 Münster Germany www.iontof.com Registergericht: Amtsgericht Münster, HRB 10680 Geschäftsführer: Dr. Ewald Niehuis ウェブサイト … Web18 jan. 2024 · IONTOF M6 ToF-SIMS. Time of Flight – Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface sensitive analytical technique that provides detailed elemental, isotopic and molecular information about surfaces, interfaces and thin layers with nanoscale spatial resolution and parts per billion sensitivity.
WebIONOPTIKA社(英国)はイオンビームの専門技術の会社として25年以上活動して参りました。お客様の要望に合った、特徴のある各種のイオン銃やSIMS(二次イオン質量分析 … WebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, retrospective analysis About IONTOF Data & Facts Vision
Web29 jul. 2024 · Features 1. Fast, Stable Polarity Switching for Improved Throughput and Reliable Data Because MS systems need to measure positive and negative ions at different voltages, the mass separator unit must be able to reliably control voltage for both polarities. WebIn this study, a total of ninety-three peptides mainly derived from actin, β-enolase, myosin heavy chain, and creatine kinase proteins have been identified from a size-exclusion …
Webtof-simsは,大きく分けると一次イオン源,超高真空試料 チャンバー,飛行時間型質量分析計から構成される。装置の概 観とその構造の一例(ion-tof社tof.sims5,以下の説明に …
WebOverview. The IONICON ioniAPi-TOF is a modular and robust Time-of-Flight mass spectrometer designed for the detection and mass analysis of ions generated at … op shops petoneWebIONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). ... ION-TOF … porterhouse bar and grill oxfordWebField proven and efficient TOF-SIMS tool which outperforms most of its external rivals. Low Energy Ion Scattering. Qtac. Extremely surface sensitive instrument, providing unique … op shops otakiWebIONTOF Japan: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis op shops palmerstonWeb4 okt. 2024 · As an IMS technology, time-of-flight–secondary ion mass spectrometry (TOF–SIMS) provides both mass spectra (chemical information) and ion images (spatial information) for biomolecules on ... op shops paeroaWebtof-sims は、大きく分けると一次イオン源、超高真空試料チャンバー、飛行時間型質量分析計から構成される。装置の概観とその構造の一例(ion-tof社tof.sims5、以下の説明に … op shops poriruaWebAPCI(Atmospheric Pressure Chemical Ionization)質量分析計は、その幅広い応用性により、法医学サンプルの分析をサポートします。 GC-APCI IIと高分解能TOF質量分析計 … op shops parramatta